Defect studies in HVPE GaN by positron annihilation spectroscopy

Author(s):

F. Tuomisto ( Helsinki Univ. of Technology (Finland) )  

Publication title:

Gallium nitride materials and devices II : 22-25 January 2007, San Jose, California, USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

6473

Pub. Year:

2007

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819465863 [0819465860]

Language:

English

Call no.:

P63600/6473

Type:

Conference Proceedings