Near-field microwave diagnostics with nonlinear-optical sensors

Near-field microwave diagnostics with nonlinear-optical sensors

Author(s):

J. F. Whitaker ( Univ. of Michigan (USA) and Opteos Inc. (USA) )
K. Yang ( Opteos Inc. (USA) )
C. Chen ( Univ. of Michigan (USA) )

Publication title:

Ultrafast phenomena in semiconductors and nanostructure materials XI and semiconductor photodetectors IV : 22-24 January 2007, San Jose, California, USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

6471

Pub. Year:

2007

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819465849 [0819465844]

Language:

English

Call no.:

P63600/6471

Type:

Conference Proceedings

Details

TDL ID:	ZA00046779
Series ID:	PA00000029
Conf. info. (Name):	Photonics West - Optoelectronic Materials and Devices : Ultrafast Phenomena in Semiconductors and Nanostructure Materials ; Semiconductor Photodetectors
Conf. info. (Number):	2007 : 11th ; 4th
Conf. info. (Venue):	San Jose, California, USA
Conf. info. (Date):	2007.01.22-2007.01.24

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