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Sensitivity analysis of a photonic crystal structure for index-of-refraction sensing

Author(s):
O. Levi ( Stanford Univ. (USA) )
M. M. Lee ( Stanford Univ. (USA) )
J. Zhang ( Ctr. for High Technology Materials, Univ. of New Mexico (USA) )
V. Lousse ( Stanford Univ. (USA) )
S. R. J. Brueck ( Ctr. for High Technology Materials, Univ. of New Mexico (USA) )
S. Fan ( Stanford Univ. (USA) )
J. S. Harris ( Stanford Univ. (USA) )
2 more
Publication title:
Nanoscale imaging, spectroscopy, sensing, and actuation for biomedical applications IV : 23-24 January 2007, San Jose, California, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6447
Pub. Year:
2007
Paper no.:
64470P
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
16057422
ISBN:
9780819465603 [0819465607]
Language:
English
Call no.:
P63600/6447
Type:
Conference Proceedings

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