Multi-wavelength digital holographic microscopy for sub-micron topography of reflecting specimens

Author(s):

F. Montfort ( Ecole Polytechnique Federale de Lausanne (Switzerland) )

F. Charriere ( Ecole Polytechnique Federale de Lausanne (Switzerland) )

J. Kuhn ( Ecole Polytechnique Federale de Lausanne (Switzerland) )

T. Colomb ( Ctr. Hospitalier Univ. Vaudois (Switzerland) )

E. Cuche ( Lyncee Tec SA (Switzerland) )

Y. Emery ( Lyncee Tec SA (Switzerland) )

P. Marquet ( Ctr. Hospitalier Univ. Vaudois (Switzerland) )

C. Depeursinge ( Ecole Polytechnique Federale de Lausanne (Switzerland) )

3 more

Publication title:

Three-dimensional and multidimensional microscopy : image acquisition and processing XIV : 23-25 January 2007, San Jose, California, USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

6443

Pub. Year:

2007

Paper no.:

64430K

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

16057422

ISBN:

9780819465566 [0819465569]

Language:

English

Call no.:

P63600/6443

Type:

Conference Proceedings