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Absolute and relative quantification and calibration for sectioning fluorescence microscopy using standardized uniform fluorescent layers and SIPchart-based correction procedures

Author(s):
  • J. M. Zwier ( Swammerdam Institute for Life Sciences, Univ. of Amsterdam (Netherlands) )
  • L. Oomen ( Netherlands Cancer Institute (Netherlands) )
  • L. Brocks ( Netherlands Cancer Institute (Netherlands) )
  • K. Jalink ( Netherlands Cancer Institute (Netherlands) )
  • G. J. Brakenhoff ( Swammerdam Institute for Life Sciences, Univ. of Amsterdam (Netherlands) )
Publication title:
Three-dimensional and multidimensional microscopy : image acquisition and processing XIV : 23-25 January 2007, San Jose, California, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6443
Pub. Year:
2007
Paper no.:
64430C
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
16057422
ISBN:
9780819465566 [0819465569]
Language:
English
Call no.:
P63600/6443
Type:
Conference Proceedings

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