On-chip differential interference contrast (DIC) phase imager and beam profiler based on Young's interference

On-chip differential interference contrast (DIC) phase imager and beam profiler based on Young's interference

Author(s):

X. Cui ( California Institute of Technology (USA) )
M. Lew ( California Institute of Technology (USA) )
X. Heng ( California Institute of Technology (USA) )
C. Yang ( California Institute of Technology (USA) )

Publication title:

Imaging, manipulation, and analysis of biomolecules, cells, and tissues V : 22-24 January 2007, San Jose, California, USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

6441

Pub. Year:

2007

Paper no.:

64411F

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

16057422

ISBN:

9780819465542 [0819465542]

Language:

English

Call no.:

P63600/6441

Type:

Conference Proceedings

Details

TDL ID:	ZA00046749
Series ID:	PA00000029
Conf. info. (Name):	SPIE BiOS : Imaging, Manipulation, and Analysis of Biomolecules, Cells, and Tissues
Conf. info. (Number):	2007 : 5th
Conf. info. (Venue):	San Jose, CA, USA
Conf. info. (Date):	2007.01.22-2007.01.24
Note for article:	64411F ; 5th Symposium on Imaging, manipulation, and analysis of biomolecules, cells, and tissues, 22-24 January 2007, San Jose, California, USA

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