Blank Cover Image

Retinal thermal damage threshold studies for multiple pulses

Author(s):
  • K. Schulmeister ( Austrian Research Ctrs. GesmbH (Austria) )
  • B. Seiser ( Austrian Research Ctrs. GesmbH (Austria) )
  • F. Edthofer ( Austrian Research Ctrs. GesmbH (Austria) )
  • J. Husinsky ( Austrian Research Ctrs. GesmbH (Austria) )
  • L. Farmer ( Austrian Research Ctrs. GesmbH (Austria) )
Publication title:
Ophthalmic technologies XVII : 20-21 and 23 January 2007, San Jose, California, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6426
Pub. Year:
2007
Paper no.:
642626
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
16057422
ISBN:
9780819465399 [0819465399]
Language:
English
Call no.:
P63600/6426
Type:
Conference Proceedings

Similar Items:

K. Schulmeister, R. Gilber, B. Seiser, F. Edthofer, J. Husinsky

Society of Photo-optical Instrumentation Engineers

7 Conference Proceedings Ultrashort-laser-pulse retinal damage

Rockwell,B.A., Roach,W.P., Payne,D.J., Kennedy,P.K., Druessel,J.J., Amnotte,R.E., Eilert,B., Phillips,S.L., …

SPIE-The International Society for Optical Engineering

Schulmeister, K., Husinsky, J., Seiser, B., Edthofer, F., Tuschl, H., Lund, D. J.

SPIE - The International Society of Optical Engineering

Zuclich,J.A., Lund,D.J., Edsall,P.R., Hollins,R.C., Smith,P.A., Stuck,B.E., McLin,L.N., Kennedy,P.K., Till,S.J.

SPIE - The International Society for Optical Engineering

Lund, D. J., Schulmeister, K., Seiser, B., Edthofer, F.

SPIE - The International Society of Optical Engineering

Sliney,D.H., Mellerio,J., Schulmeister,K.

SPIE-The International Society for Optical Engineering

Schulmeister, K., Edthofer, F., Seiser, B., Grabner, U., Vees, G.

SPIE - The International Society of Optical Engineering

Kennedy, P.K., Zuclich, J.A., Lund, D.J., Edsall, P.R., Till, S., Stuck, B.E., Hollins, R.C.

SPIE - The International Society of Optical Engineering

Schulmeister, K., Gilber, R., Edthofer, F., Seiser, B., Vees, G.

SPIE - The International Society of Optical Engineering

Zuclich,J.A., Lund,D.J., Edsall,P.R., Hollins,R.C., Smith,P.A., Stuck,B.E., McLin,L.N.

SPIE - The International Society for Optical Engineering

Rockwell,B.A., Toth,C.A., Stolarski,D.J., Noojin,G.D., Kennedy,P.K., Shaver,J.H., Buffington,G.D., Thomas,R.J.

SPIE-The International Society for Optical Engineering

Mann,K.R., Granitza,B., Eva,E.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12