An improved normalized cross-correlation algorithm for inspection of printed circuit boards

An improved normalized cross-correlation algorithm for inspection of printed circuit boards

Author(s):: F. Wang ( Xiamen Univ. (China) )
Publication title:: Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo -Electronic Technology, and Artificial Intelligence : 13-15 October 2006, Beijing, China
Title of ser.:: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:: 6357
Pub. Year:: 2006
Pt.:: 1
Paper no.:: 635719
Page(from):: 635719-1
Page(to):: 635719-5
Pages:: 5
Pub. info.:: Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:: 0277786X
ISBN:: 9780819464521 [081946452X]
Language:: English
Call no.:: P63600/6357
Type:: Conference Proceedings

Details

TDL ID:	ZA00046714
Series ID:	PA00000029
Conf. info. (Name):	International Symposium on Instrumentation and Control Technology
Conf. info. (Number):	2006 : 6th
Conf. info. (Venue):	Beijing, China
Conf. info. (Date):	2006.10.13-2006.10.15
Note for article:	635719 ; 6th International Symposium on Instrumentation and Control Technology, 13-15 October 2006, Beijing, China

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