Industrial applications of the wavelet and multi-resolution-based signal/image processing: a review

Industrial applications of the wavelet and multi-resolution-based signal/image processing: a review

Author(s):

F. Truchetet ( Le2i-CNRS, Univ. de Bourgogne (France) )
O. Laligant ( Le2i-CNRS, Univ. de Bourgogne (France) )

Publication title:

Eighth International Conference on Quality Control by Artificial Vision : 23-25 May 2007, Le Creusot, France

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

6356

Pub. Year:

2007

Paper no.:

63560H

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819464514 [0819464511]

Language:

English

Call no.:

P63600/6356

Type:

Conference Proceedings

Details

TDL ID:	ZA00046713
Series ID:	PA00000029
Conf. info. (Name):	International Conference on Quality Control by Artificial Vision
Conf. info. (Number):	2007 : 8th
Conf. info. (Venue):	Le Creusot, France
Conf. info. (Date):	2007.03.23-2007.03.25
Note for article:	63560H ; 8th International Conference on Quality Control by Artificial Vision, 23-25 May 2007, Le Creusot, France

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