Blank Cover Image

Application of Computational Intelligence to Investigation of Defect Centers in Semi-Insulating Materials by Photoinduced Transient Spectroscopy

Author(s):
Publication title:
Semiconductor defect engineering--materials, synthetic structures and devices II : symposium held April 9-13, 2007, San Francisco, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
994
Pub. Year:
2007
Page(from):
185
Page(to):
190
Pages:
6
Pub. info.:
Warrendale, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558999541 [155899954X]
Language:
English
Call no.:
M23500/994
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings High-Resolution Photoinduced Transient Spectroscopy of Defect Centers in Undoped Semi-Insulating 6H-SiC

Pawel Kaminski, Roman Kozlowski, Marcin Miczuga, Michal Pawlowski, Michal Kozubal, Jaroslaw Zelazko

Materials Research Society
7 Conference Proceedings Deep-level defects in semi-insulating LT MBE GaAs

Kozlowski,R., Kaminski,P., Kordos,P., Pawlowski,M., Cwirko,R.

SPIE-The International Society for Optical Engineering
2 Conference Proceedings CHARACTERIZATION OF DEEP-LEVEL DEFECTS IN SEMI-INSULATING GaAs AND InP BY PHOTOINDUCED TRANSIENT SPECTROSCOPY (PITS)

Kaminski, Pawel

Materials Research Society
8 Conference Proceedings Application of least-squares support vector machine (LS-SVM) to determination of deep level defect centers parameters in semi-insulating GaAs [6347-109]

Jankowski, S., Kniota, M., Koztowski, R.

SPIE - The International Society of Optical Engineering
3 Conference Proceedings Laplace transform photoinduced transient spectroscopy: a new powerful tool for defect characterization in semi-insulating materials

Pawlowski, M., Kaminski, P., Kozlowski, R., Miczuga, M.

SPIE-The International Society for Optical Engineering
9 Conference Proceedings High-resolution PITS studies of deep-level defects in semi-insulating GaAs and InP

Kaminski,P., Pawlowski,M., Kozlowski,R., Cwirko,R., Palczewska,M.

SPIE-The International Society for Optical Engineering
4 Conference Proceedings Characterization of point defects in semi-insulating InP:Fe by high-resolution photoinduced transient spectroscopy

Kozlowski, R., Kaminski, P., Pawlowski, M.

SPIE-The International Society for Optical Engineering
10 Conference Proceedings Analysis of two-dimensional PITS spectra for characterization of defect centers in high-resistivity materials

Pawlowski,M., Miczuga,M., Kaminski,P., Kozlowski,R.

SPIE-The International Society for Optical Engineering
5 Conference Proceedings Pareto selection of neural network approximation subject to virtual leave-one-out criteria and application to defect centers identification in semi-insulating …

Jankowski, S., Ojczyk, M.

SPIE - The International Society of Optical Engineering
11 Conference Proceedings Deep-Level Defects in Electron Irradiated 6H-SiC

Michal S. Kozubal, Pawel Kaminski, Stanislaw Warchol, Katarzyna Racka-Dzietko, Krzysztof Grasza, Emil Tymicki

Materials Research Society
6 Conference Proceedings Digital analysis of photo-induced current transients in semi-insulating GaAs and InP

Kaminski,P., Pawlowski,M., Cwirko,R., Palczewska,M., Kozlowski,R.

SPIE-The International Society for Optical Engineering
12 Conference Proceedings Electronic properties of grown-in defects in semi-insulating GaAs

Koztowski,R., Pawiowski,M., Kaminski,P., Cwirko,J.

SPIE - The International Society for Optical Engineering
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12