Characterisation of Solid Supported Nanostructured Thin Films by Scanning Angle Reflectometry and UV-Vis Spectrometry

Characterisation of Solid Supported Nanostructured Thin Films by Scanning Angle Reflectometry and UV-Vis Spectrometry

Author(s):

Publication title:

Materials science, testing and informatics III : proceedings of the 5th Hungarian Conference on Materials Science, Testing and Informatics, Balatonfüred, Hungary, October 9-11, 2005

Title of ser.:

Materials science forum

Ser. no.:

537-538

Pub. Year:

2007

Page(from):

329

Page(to):

336

Pages:

8

Pub. info.:

Aedermannsdorf, Switzerland: Trans Tech Publications

ISSN:

02555476

ISBN:

9780878494262 [087849426X]

Language:

English

Call no.:

M23650

Type:

Conference Proceedings

Details

TDL ID:	ZA00046594
Series ID:	PA00000012
Conf. info. (Name):	Hungarian Conference on Materials Science, Testing and Informatics
Conf. info. (Number):	2005 : 5th
Conf. info. (Venue):	Balatonfured, Hungary
Conf. info. (Date):	2005.10.09-2005.10.11

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