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Investigation of photoelectron properties in cubic AgCI emulsion with uniformly doped formate ions [6149-68]

Author(s):
Fu, G.S. ( Hebei Univ. (China) )
Zhou,X. ( Hebei Univ. (China) )
Yang,S.P. ( Hebei Univ. (China) )
Li, X. W. ( Hebei Univ. (China) )
Tian,X.D. ( Hebei Univ. (China) )
Han, L. ( Hebei Univ. (China) )
1 more
Publication title:
2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6149
Pub. Year:
2006
Page(from):
61491W
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819461889 [0819461881]
Language:
English
Call no.:
P63600/6149
Type:
Conference Proceedings

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