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Defect study on infrared thin film of 3.8um [6149-38]

Author(s):
  • Zhang, Y. ( Institute of Optics and Electronics (China) and Graduate School of the Chinese Academy of Sciences (China) ) , ( Institute of Optics and Electronics (China) )
  • Xu, H. ( Institute of Optics and Electronics (China) )
  • Ling, N. ( Institute of Optics and Electronics (China) )
Publication title:
2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6149
Pub. Year:
2006
Page(from):
6149012
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819461889 [0819461881]
Language:
English
Call no.:
P63600/6149
Type:
Conference Proceedings

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