Blank Cover Image

Flexible sparse and dense OPC algorithms [5853-54]

Author(s):
Cobb, N. ( Mentor Graphics Corp. (USA) )  
Publication title:
Photomask and Next-Generation Lithography Mask Technology XII
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5853
Pub. Year:
2005
Pt.:
2
Page(from):
693
Page(to):
702
Pages:
10
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819458537 [0819458538]
Language:
English
Call no.:
P63600/5853
Type:
Conference Proceedings

Similar Items:

Cobb,N.B., Zakhor,A.

SPIE-The International Society for Optical Engineering

7 Conference Proceedings Toward standard process models for OPC

Y. Granik, D. Medvedev, N. Cobb

SPIE - The International Society of Optical Engineering

2 Conference Proceedings Flexible MRC rules for OPC

Cobb, N. B., Miloslavsky, E., Lippincott, G.

SPIE - The International Society of Optical Engineering

Cobb, N.B., Granik, Y.

SPIE-The International Society for Optical Engineering

Cobb, N., Dudau, D.

SPIE - The International Society of Optical Engineering

Word V, J., Cobb, N. B.

SPIE - The International Society of Optical Engineering

4 Conference Proceedings New concepts in OPC

Cobb, N., Granik, Y.

SPIE - The International Society of Optical Engineering

10 Conference Proceedings Automatic OPC mask shape repair

J. Word, D. Dudau, N. Cobb

SPIE - The International Society of Optical Engineering

Granik, Y., Cobb, N., Do, T.

SPIE-The International Society for Optical Engineering

Granik, Y., Cobb, N., Medvedev, D.

SPIE - The International Society of Optical Engineering

6 Conference Proceedings Model-based OPC using the MEEF matrix

Cobb, N,B,, Granik, Y.

SPIE-The International Society for Optical Engineering

Granik, Y., Cobb, N.B.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12