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Reliability of InGaN laser diodes grown on low dislocation density bulk GaN substrates [6184-16]

Author(s):
Marona L.
Wisniewski P.
Prystawko P.
Porowski S.
Suski T. ( Institute of High Pressure Physics (Poland) )
Leszczynsk M.i
Grzegory I.
Czernecki R.
PerlinP. ( TopGaN Ltd. (Poland) )
Riemann T.
Christen J. ( Otto-von-Guericke-Univ. (Germany) )
6 more
Publication title:
Semiconductor Lasers and Laser Dynamics II
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6184
Pub. Year:
2006
Page(from):
61840G
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819462404 [0819462403]
Language:
English
Call no.:
P63600/6184
Type:
Conference Proceedings

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