Retrieval of plant biophysical parameters through inversion of PROSAIL model [6411-15]

Retrieval of plant biophysical parameters through inversion of PROSAIL model [6411-15]

Author(s):

Tripathi, R.

Sahoo, R.N.

Sehgal, V.K.

Tomar, R.K. ( Indian Agricultural Research Institute (India) )

Pandey, S. ( Rice-Wheat Consortium for Indo-Gangetic Plains (India) )

Chakraborty, D.

Kaira, N. ( Indian Agricultural Research Institute (India) )

2 more

Publication title:

Agriculture and hydrology applications of remote sensing : 15-17 November 2006, Goa, India

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

6411

Pub. Year:

2006

Page(from):

64110F

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819465184 [0819465186]

Language:

English

Call no.:

P63600/6411

Type:

Conference Proceedings

Details

TDL ID:	ZA00016403
Series ID:	PA00000029
Conf. info. (Name):	Asia-Pacific Environmental Remote Sensing : Agriculture and hydrology applications of remote sensing
Conf. info. (Number):	2006
Conf. info. (Venue):	Goa, India
Conf. info. (Date):	2006.11.15-2006.11.17

Similar Items:

1 Conference Proceedings For assessing yields under extreme climatic events using crop simulation models: aerosol layer effects on growth and yield of wheat, rice, and sugarcane … Kalra, N., Chakraborty, D., Sahoo, R.N., Sehgal, V.K., Singh, M. SPIE - The International Society of Optical Engineering	7 Conference Proceedings Digital spatial soil and land information for agriculture development [6411-66] Sharma, R.K., Laghathe, P., Meena, R., Barman, A.K., Das, S.N. SPIE - The International Society of Optical Engineering
2 Conference Proceedings Yield estimation in farmer& fields at Alipur Block of Delhi by using crop model and satellite data [6411-07] Sehgal, V.K., Kaira, N., Singh, A.K., Dadhwal, V.K., Harith, R.C., Sahoo, R.N., Sharma, S.K. SPIE - The International Society of Optical Engineering	8 Conference Proceedings Triangular path interferometer for stress analysis Sarkar,S.K., Chakraborty,R.N., Basuray,A. SPIE - The International Society for Optical Engineering
3 Conference Proceedings Methodology for national wheat yield forecast using wheat growth model, WTGROWS, and remote sensing inputs [6411-06] Kaira, N., Aggarwal, P.K., Singh, A.K., Dadhwal, V.K., Sehgal, V.K., Harith, R.C., Sharma, S.K. SPIE - The International Society of Optical Engineering	9 Conference Proceedings Compact Folded-Line RF Power Dividers Lim, C., Settaluri, R.K., Tripathi, V.K., Weisshaar, A. IMAPS
4 Conference Proceedings Modeling and Characterization of Multiple Coupled Lines in Multilayer Structures Using FDTD Kim,Yoonsuk, Tripathi,A., Settaluri,R.K., Weisshaar,A., Tripathi,V.K. SPIE - The International Society for Optical Engineering, IMAPS	10 Conference Proceedings Infrared Spectroscopy of Epitaxial Antimony Sulpho Iodide Thin Films Kotru, S., Surthi, S., Pandey, R.K., Donnelly, D. Materials Research Society
5 Conference Proceedings Land use, land cover change analysis with multitemporal remote sensing data K. Suzanchi, R. N. Sahoo, N. Kalra, S. Pandey SPIE - The International Society of Optical Engineering	11 Conference Proceedings Surface Complexation Modeling of Am(III) Sorbed on γ-Alumina Sumit Kumar, B.S. Tomar, V.K. Manchanda Materials Research Society
6 Conference Proceedings Modeling of General Non-Uniform On-Chip Interconnect Structures Weisshaar,Andreas, Sundberg,G., Lutz,R.D., Hahm,Y.C., Settaluri,R.K., Tripathi,V.K., Zheng,J. SPIE - The International Society for Optical Engineering	12 Conference Proceedings Characterisation of Ion Implanted Layers in GaAs and Influence of Various Parameters on Device Performance Bhattacharya,B., Sai Saravanan,G., Khatri,R.K., Naik,A.A., Rawal,D.S., Sharma,H.S., Sehgal,B.K., Gulati,R., Vyas,H.P., … Narosa Publishing House

1

2

3

4

5

6

7

8

9

10

11

12