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Wavelet-based feature extraction method for inspection using cross-sensor image data [6383-13]

Author(s):
Publication title:
Wavelet Applications in Industrial Processing IV
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6383
Pub. Year:
2006
Page(from):
63830F
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819464811 [0819464813]
Language:
English
Call no.:
P63600/6383
Type:
Conference Proceedings

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