Onboard calibration status of ASTER [6361-30]

Author(s):

• Sakuma, F. ( National Metrology Institute of Japan/AIST (Japan) )
• Sato, T. ( Japan Resources Observation System and Space Utilization Organization (Japan) )
• Inada, H. ( NEC TOSHIBA Space System (Japan) )
• Akagi, S. ( Mitsubishi Electric Corp. (Japan) )
• Ono, H. ( Fujitsu Ltd. (Japan) )

Publication title:

Sensors, systems, and next-generation satellites X : 11-13 September 2006, Stockholm, Sweden

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

6361

Pub. Year:

2006

Page(from):

63610W

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819464569 [0819464562]

Language:

English

Call no.:

P63600/6361

Type:

Conference Proceedings