Blank Cover Image

Power quality disturbance classification based on wavelet transform and self-organizing learning neural network [6358-175]

Author(s):
  • Ding, G. ( Hebei Univ. of Engineering (China) )
  • Liu, L. ( Beijing Uni.v of Aeronautics and Astronautics (China) )
Publication title:
Sixth International Symposium on Instrumentation and Control Technology: Sensors, Automatic Measurement, Control, and Computer Simulation
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6358
Pub. Year:
2006
Pt.:
2
Page(from):
63584V
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819464538 [0819464538]
Language:
English
Call no.:
P63600/6358
Type:
Conference Proceedings

Similar Items:

Liu, L., Shen, S., Liu, Q.

SPIE - The International Society of Optical Engineering

Liu, G., Yang, G., Wang, Z.

SPIE - The International Society of Optical Engineering

H.C. Chen, Y.C. Tzeng

Society of Photo-optical Instrumentation Engineers

L. Xu, G. Tao

SPIE - The International Society of Optical Engineering

Carpenter A. Gail, Grossberg Stephen

Springer-Verlag

Ding,Y., Liu,L., Zhong,Y., Jin,W.

SPIE-The International Society for Optical Engineering

Kaburlasas, V. G., Chatzis, V, Tsiantos, V., Theodorides, M.

SPIE - The International Society of Optical Engineering

Fan, C.L., Jin, Z.H., Tian, W.F.

SPIE-The International Society for Optical Engineering

Liu, Bin, Wang, Xi

Trans Tech Publications

Schouten,T.E., Liu,Z., Feng,L., Junjie,G.

SPIE-The International Society for Optical Engineering

G. Ding, P. Pang

Society of Photo-optical Instrumentation Engineers

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12