Blank Cover Image

Thermal analysis based on rate-equation model for VCSELs [6352-138]

Author(s):
Publication title:
Optoelectronic materials and devices : 5-7 September, 2006, Gwangju, South Korea
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6352
Pub. Year:
2006
Pt.:
2
Page(from):
63523L
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819464477 [0819464473]
Language:
English
Call no.:
P63600/6352
Type:
Conference Proceedings

Similar Items:

Z. Tian, X. Lei, Z. Gao

Society of Photo-optical Instrumentation Engineers

B.X. Sun, X.Z. Gong, Y. Liu, W.J. Chen, Z.H. Wang

Trans Tech Publications

Tian, Z., Wang, J., Gao, Z.

SPIE - The International Society of Optical Engineering

L.J. Zhang, X.Z. Gong, Y.L. Tian, Z.H. Wang, F. Gao

Trans Tech Publications

Zhou, Z., Gao, D., Wang, Y., Chen, J.

SPIE - The International Society of Optical Engineering

Liu, H., Shum, P., Zhang, X., Liu, D.

SPIE - The International Society of Optical Engineering

Wang, Z., Gao, C., Tian, J., Liu, J., Chen, X.

SPIE - The International Society of Optical Engineering

Pan, W., Zhang, X.-X., Luo, B., Deng, G.

SPIE-The International Society for Optical Engineering

Lin,S., Kang,X., Wang,Q., Gao,J., Gao,H., Wang,H., Wang,L., Zhang,C.

SPIE-The International Society for Optical Engineering

J. Li, Y. Tian, W. Gao

Society of Photo-optical Instrumentation Engineers

Y. Gao, S. Tian, B. Chang, Y. Qiu, J. Qiao

Society of Photo-optical Instrumentation Engineers

H. Gai, J. Wang, Q. Tian, W. Xia, X. Xu

Society of Photo-optical Instrumentation Engineers

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12