Introduction of a die-to-database verification tool for mask geometry NGR4000 [6349-150]

Introduction of a die-to-database verification tool for mask geometry NGR4000 [6349-150]

Author(s):

Hoffman, M. J.

Yamamoto, M. ( NanoGeometry Research Inc. (Japan) )

lnoue, M. ( Topcon Corp. (Japan) )

4 more

Publication title:

Photomask Technology 2006

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

6349

Pub. Year:

2006

Pt.:

2

Page(from):

634940

Page(to):

634940

Pages:

1

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819464446 [0819464449]

Language:

English

Call no.:

P63600/6349

Type:

Conference Proceedings

Details

TDL ID:	ZA00016353
Series ID:	PA00000029
Conf. info. (Name):	SPIE Photomask Technology : Annual BACUS Symposium on Photomask Technology
Conf. info. (Number):	2006 : 26th
Conf. info. (Venue):	Monterey, CA, USA
Conf. info. (Date):	2006.09.19-2006.09.22

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