Application of least-squares support vector machine (LS-SVM) to determination of deep level defect centers parameters in semi-insulating GaAs [6347-109]

Application of least-squares support vector machine (LS-SVM) to determination of deep level defect centers parameters in semi-insulating GaAs [6347-109]

Author(s):

Jankowski, S.
Kniota, M. ( Warsaw Univ. of Technology (Poland) )
Koztowski, R. ( Institute of Electronic Materials Technology (Poland) )

Publication title:

Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2006

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

6347

Pub. Year:

2006

Pt.:

2

Page(from):

634731

Page(to):

634731

Pages:

1

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819464316 [0819464317]

Language:

English

Call no.:

P63600/6347

Type:

Conference Proceedings

Details

TDL ID:	ZA00016351
Series ID:	PA00000029
Conf. info. (Name):	IEEE-SPIE Symposium on Photonics and Web Engineering Photonics & Electronics for Accelerators and HEP
Conf. info. (Number):	2006 : 18th
Conf. info. (Venue):	Wilga, Poland
Conf. info. (Date):	2006.05.29-2006.06.04

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