Laperle, P., Pare, C., Zheng, H., Croteau, A., Taillon, Y.
SPIE - The International Society of Optical Engineering
|
Lafond, C., Osouf, J., Laperle, P., Saucy, J..-L., Desrosiers, C., Morency, S., Croteau, A., Parent, A.
SPIE - The International Society of Optical Engineering
|
Croteau, A., Pare, C, Zheng, H, Laperle, P., Taillon, Y.
SPIE - The International Society of Optical Engineering
|
O. B. Jensen, A. Klehr, F. Dittmar, B. Sumpf, G. Erbert, P. E. Andersen, P. M. Petersen
SPIE - The International Society of Optical Engineering
|
P. Laperle, C. Pare, H. Zheng, A. Croteau
SPIE - The International Society of Optical Engineering
|
Jager, M., Caplette, S., Verville, P., Villanueve, A.
SPIE - The International Society of Optical Engineering
|
Drolet, M., Labranche, B., Lemieux, D., Laperle, P., Cantin, D., Taillon, Y., Lozofsky, D., Nyairo, K.
SPIE - The International Society of Optical Engineering
|
S. Grünsteidl, J. M. Sousa, G. O'Connor, T. Glynn
Society of Photo-optical Instrumentation Engineers
|
Pare, C.
SPIE - The International Society of Optical Engineering
|
Wang, J., Lu, F., Xie, C., Wang, H.
SPIE - The International Society of Optical Engineering
|
B. Sumpf, G. Erbert, J. Fricke, P. Froese, R. Haring, W. G. Kaenders, A. Klehr, F. Lison, P. Ressel, H. Wenzel, M. …
SPIE - The International Society of Optical Engineering
|
R. L. Farrow, G. R. Hadley, D. A. V. Kliner, J. P. Koplow
SPIE - The International Society of Optical Engineering
|