Blank Cover Image

On the crucial role of the insulator-semiconductor interface in organic thin-film transistors (Invited Paper) [6336-15]

Author(s):
Horowitz, G.
Mottaghi, M.
Lang, P.
Rodriguez, F.
Yassar, A. ( ITODYS, Univ. Denis-Diderot (France) )
Lenfant, S.
Vuillaume, D. ( IEMN, Univ. of Lille (France) )
2 more
Publication title:
Organic Field-Effect Transistors V
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6336
Pub. Year:
2006
Page(from):
63360G
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819464156 [0819464155]
Language:
English
Call no.:
P63600/6336
Type:
Conference Proceedings

Similar Items:

Garnier, F., Horowitz, G., Yassar, A., Hajlaoui, R.

Electrochemical Society

Kim, D. H., Cho, K.

SPIE - The International Society of Optical Engineering

Gu, G., Kane, M. G.

SPIE - The International Society of Optical Engineering

Benson, N., Ahles, M., Schidleja, M., Gassmann, A., Mankel, E., Mayer, T., Meizer, C., Schmechel, R., von Seggern, H.

SPIE - The International Society of Optical Engineering

Garnier F., Deloffre F., Yassar A., Horowitz G., Hajlaoui R.

Kluwer Academic Publishers

Fortunato, G., Valletta, A., Bonfiglietti, A., Cuscuna, M., Gaucci, P., Mariucci, L., Pecora, A., Brotherton, S.D., …

SPIE-The International Society for Optical Engineering

Chabinyc, M. L., Sallea, A., Endicatt, F, Ong, B. S., Wu, Y., Liu, P., Heeney, M., McCullach, I.

SPIE - The International Society of Optical Engineering

Natelson, D., Hamadini, B. H., Ciszek, J. W., Corley, D. A., Tour, J. M.

SPIE - The International Society of Optical Engineering

Hamilton, R., Bailey, C., Duffy, W., Heeney, M., Shkunov, M., Sparrowe, D., Tierney, S., McCulloch, I., Kline, R. J., …

SPIE - The International Society of Optical Engineering

C. Daniel Frisbie

American Institute of Chemical Engineers

Lee, T. -W., Shin, J. H., Kim, J. Y., Byun, Y.

SPIE - The International Society of Optical Engineering

Punke M., Mozer S., Stroisch M., Bastian G., Lemmer U., Rabus D. G, Henzi P.

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12