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Quantitative analysis of mineral content in enamel using synchrotron microtomography and microhardness analysis [6318-83]

Author(s):
Delbem, A. C. B.
Vieira, A. M.
Sassaki, K. T. ( Sao Paulo State Univ. (Brazil) )
Cannon, M. L. ( Childrens Memorial Medical Ctr. (USA) )
Stock, S. R. ( Northwestern Univ. (USA) )
Xiao, X.
De Carlo, F. ( Argonne National Lab. (USA) )
2 more
Publication title:
Developments in X-ray tomography V : 15-17 August 2006, San Diego, California, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6318
Pub. Year:
2006
Page(from):
631824
Page(to):
631824
Pages:
1
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
16057422
ISBN:
9780819463975 [0819463973]
Language:
English
Call no.:
P63600/6318
Type:
Conference Proceedings

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