Experimental evaluation of low-resolution CT regulated tomosynthesis using a flat-panel detector [6318-76]
- Author(s):
- Zeng, K.
- Yu, H. ( Univ. of Iowa (USA) )
- Grasruck, M.
- Schmidt, B. ( Siemens AG Medical Solutions (Germany) )
- Wang, G. ( Univ. of Iowa (USA) )
- Publication title:
- Developments in X-ray tomography V : 15-17 August 2006, San Diego, California, USA
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 6318
- Pub. Year:
- 2006
- Page(from):
- 63181X
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 16057422
- ISBN:
- 9780819463975 [0819463973]
- Language:
- English
- Call no.:
- P63600/6318
- Type:
- Conference Proceedings
Similar Items:
1
Conference Proceedings
Perfusion analysis using a wide coverage flat-panel volume CT: feasibility study
SPIE - The International Society of Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
2
Conference Proceedings
Combination of CT scanning and fluoroscopy imaging on a flat-panel CT scanner [6142-91]
SPIE - The International Society of Optical Engineering |
8
Conference Proceedings
Parallelism of iterative CT algorithm based on local reconstruction [6318-67]
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
9
Conference Proceedings
Flat-panel detector-based cone beam volume CT breast imaging: detector evaluation
SPIE-The International Society for Optical Engineering |
4
Conference Proceedings
Geometrical study on two tilting arcs based exact cone-beam CT for breast imaging [6318-62]
SPIE - The International Society of Optical Engineering |
10
Conference Proceedings
Image quality evaluation of a selenium-based flat-panel digital x-ray detector system based on animal studies
SPIE - The International Society for Optical Engineering |
5
Conference Proceedings
Digital breast tomosynthesis using an amorphous selenium flat panel detector
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
12
Conference Proceedings
Flat-panel-detector-based cone beam volume CT imaging: detector evaluation
SPIE - The International Society of Optical Engineering |