A hard x-ray KB- FZP microscope for tomography with sub-100-nm resolution [6318-53]

A hard x-ray KB- FZP microscope for tomography with sub-100-nm resolution [6318-53]

Author(s):

Rau, C. ( Univ. of Illinois at Urbana-Champaign (USA), Purdue Univ. (USA), and National Institute of Standards and Technology (USA) )

Crecea, V. ( Univ. of Illinois at Urbana-Champaign (USA) )

Richter, C.-P. ( Feinberg School of Medicine, Northwestern Univ. (USA) )

Peterson, K. M.

Jemian, P. R. ( Univ. of Illinois at Urbana-Champaign (USA) )

Neuhausler, U. ( Univ. Bielefeld (Germany) )

Schneider, G. ( BESSY GmbH (Germany) )

Yu, X.

Braun, P. V.

Chiang, T.-C. ( Univ. of Illinois at Urbana-Champaign (USA) )

Robinson, I. K. ( Univ. College London (United Kingdom) )

6 more

Publication title:

Developments in X-ray tomography V : 15-17 August 2006, San Diego, California, USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

6318

Pub. Year:

2006

Page(from):

63181G

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

16057422

ISBN:

9780819463975 [0819463973]

Language:

English

Call no.:

P63600/6318

Type:

Conference Proceedings

Details

TDL ID:	ZA00016324
Series ID:	PA00000029
Conf. info. (Name):	Optics & Photonics : Developments in X-ray tomography
Conf. info. (Number):	2006 : 5th
Conf. info. (Venue):	San Diego, CA, USA
Conf. info. (Date):	2006.08.15-2008.08.17

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