At-wavelength figure metrology of total reflection mirrors in hard x-ray region (Invited Paper) [6317-09]

At-wavelength figure metrology of total reflection mirrors in hard x-ray region (Invited Paper) [6317-09]

Author(s):

Yumoto, H.

Sano, Y. ( Osaka, Univ. (Japan) )

Yabashi, M. ( Spring-8/Japan Synchrotron Radiation Research Institute (Japan) )

Nishino, Y.

Tamasaku, K. ( Spring-8/RIKEN (Japan) )

Ishikawa, T. ( Spring-8/Japan Synchrotron Radiation Research Institute (Japan) and Spring-8/RIKEN (Japan) )

Yamauchi, K. ( Osaka Univ. (Japan) )

7 more

Publication title:

Advances in X-ray/EUV optics, components, and applications : 14-16 August 2006, San Diego, California, USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

6317

Pub. Year:

2006

Page(from):

631709

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819463968 [0819463965]

Language:

English

Call no.:

P63600/6317

Type:

Conference Proceedings

Details

TDL ID:	ZA00016323
Series ID:	PA00000029
Conf. info. (Name):	Optics & Photonics : Advances in X-ray/EUV optics, components, and applications
Conf. info. (Number):	2006
Conf. info. (Venue):	San Diego, CA, USA
Conf. info. (Date):	2006.08.14-2006.08.16

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