A total variation wavelet inpainting model with multilevel fitting parameters [6313-12]

Author(s):

• Chan T. F. ( The Univ. of California, Los Angeles (USA) )
• Shen J. ( The Univ. of Minnesota (USA) )
• Zhou H.-M. ( Georgia Institute of Technology (USA) )

Publication title:

Advanced signal processing algorithms, architectures, and implementations XVI : 15-16 August, 2006, San Diego, California, USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

6313

Pub. Year:

2006

Page(from):

63130C

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819463920 [0819463922]

Language:

English

Call no.:

P63600/6313

Type:

Conference Proceedings