Characterization of errors in quantum processes using finite sets of test measurements (Invited Paper) [6305-16]

Characterization of errors in quantum processes using finite sets of test measurements (Invited Paper) [6305-16]

Author(s):: Hofmann, H. F. ( Hiroshima Univ. (Japan) )
Publication title:: Quantum Communications and Quantum Imaging IV
Title of ser.:: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:: 6305
Pub. Year:: 2006
Page(from):: 63050F
Pub. info.:: Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:: 0277786X
ISBN:: 9780819463845 [0819463841]
Language:: English
Call no.:: P63600/6305
Type:: Conference Proceedings

Details

TDL ID:	ZA00016311
Series ID:	PA00000029
Conf. info. (Name):	Optics & Photonics : Quantum Communications and Quantum Imaging
Conf. info. (Number):	2006 : 4th
Conf. info. (Venue):	San Diego, CA, USA
Conf. info. (Date):	2006.08.13-2006.08.14

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