Interferometric testing through transmissive media [6293-05]

Interferometric testing through transmissive media [6293-05]

Author(s):: Han S. ( Veeco Metrology Inc. (USA) )
Publication title:: Interferometry XIII: Applications
Title of ser.:: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:: 6293
Pub. Year:: 2006
Page(from):: 629305
Page(to):: 629305
Pages:: 1
Pub. info.:: Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:: 0277786X
ISBN:: 9780819463722 [0819463728]
Language:: English
Call no.:: P63600/6293
Type:: Conference Proceedings

Details

TDL ID:	ZA00016299
Series ID:	PA00000029
Conf. info. (Name):	Optics & Photonics : Interferometry
Conf. info. (Number):	2006 : 13th
Conf. info. (Venue):	San Diego, CA, USA
Conf. info. (Date):	2006.08.16-2006.08.17

Similar Items:

1 Conference Proceedings Packaged MEMS and MOEMS measurement using through-transmissive-media (TTM) profiler [6032-03] Han, S. SPIE - The International Society of Optical Engineering	7 Conference Proceedings Photorefractive nonlinear deconvolution for one-way image transmission through aberrating media Haji-Saeed, B., Pyburn, D., Leon, R., Sengupta, S.K., Goodhue, W.D., Testorf, M.E., Kierstead, J., Khoury, J., Woods, … SPIE-The International Society for Optical Engineering
2 Conference Proceedings Interferometric testing for large optical elements Han,C., Zhang,X., Zhang,S., Ma,J., Wu,D., Zhang,B. SPIE-The International Society for Optical Engineering	8 Conference Proceedings Subaperture stitching interferometry for testing mild aspheres [6293-20] Murphy P., Fleig J., Forbes G., Miladinovic D., DeVries G., O’Donohue S. SPIE - The International Society of Optical Engineering
3 Conference Proceedings Non-destructive structural homogeneity of MOEMS arrays: applications of a through-transmissive-media interferometer on a digital mirror device-spatial light … Heine L. M., Oden P. I. SPIE - The International Society of Optical Engineering	9 Conference Proceedings Development of the interferometrical scanning probe microscope [6293-42] Dorozhovets N., Hausotte T., Hofmann N., Manske E., Jager G. SPIE - The International Society of Optical Engineering
4 Conference Proceedings Statistics of the near-field speckle pattern in transmission through random media (Invited Paper) [5924-05] Sebbah, P., Chabanov, A. A., Genack, A. Z. SPIE - The International Society of Optical Engineering	10 Conference Proceedings Surface reconstruction based on transmission interferometric testing K. Seong, J. E. Greivenkamp SPIE - The International Society of Optical Engineering
5 Conference Proceedings Interferometric sensors for application in the bladder and the lower urinary tract [6293-22] McCartney A. J., Bialkowski M., Barton J. S., Stewart L., Towers C. E., MacPherson W. N., Reuben R. L., Towers D. P. SPIE - The International Society of Optical Engineering	11 Conference Proceedings Interferometric techniques applied in packaged MEMS and MOEMS measurement [6149-01] Han, S. SPIE - The International Society of Optical Engineering
6 Conference Proceedings Application of imaging interferometry (Invited Paper) [6293-01] Reed J., Wilkinson P., O’Doherty K., Schmit J., Han S., Troke J., Teitell M., Klug W., Gimzewski J. SPIE - The International Society of Optical Engineering	12 Conference Proceedings Transmission characteristics of THz radiation through metal subwavelength holes array Y. Han, Y. Jiao, C. Zhang Society of Photo-optical Instrumentation Engineers

1

2

3

4

5

6

7

8

9

10

11

12