Nanometric displacement measurement using phase singularities in Laguerre-Gauss transform of speckle pattern [6292-34]

Nanometric displacement measurement using phase singularities in Laguerre-Gauss transform of speckle pattern [6292-34]

Author(s):

Wang, W.
Yokozeki, T.
Ihiijima, R. ( The Univ. of Electro-Communications (Japan) )
Hanson, S. G. ( Risoe National Lab. (Denmark) )
Takeda, M. ( The Univ. of Electro-Communications (Japan) )

Publication title:

Interferometry XIII: Techniques and Analysis

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

6292

Pub. Year:

2006

Page(from):

62920X

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819463715 [081946371X]

Language:

English

Call no.:

P63600/6292

Type:

Conference Proceedings

Details

TDL ID:	ZA00016298
Series ID:	PA00000029
Conf. info. (Name):	Optics & Photonics : Interferometry
Conf. info. (Number):	2006 : 13th
Conf. info. (Venue):	San Diego, CA, USA
Conf. info. (Date):	2006.08.14-2006.08.16

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