Blank Cover Image

Ray-trace simulation of the random ball test to improve microlens metrology [6292-04]

Author(s):
Publication title:
Interferometry XIII: Techniques and Analysis
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6292
Pub. Year:
2006
Page(from):
629204
Page(to):
629204
Pages:
1
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819463715 [081946371X]
Language:
English
Call no.:
P63600/6292
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings Improving metrology for micro-optics manufacturing (Invited Paper)

Davies, A.D., Bergner, B.C., Gardner, N.W.

SPIE-The International Society for Optical Engineering
7 Conference Proceedings Measurement advances for micro-refractive fabrication (Invited Paper) [5858-25]

Gardner, N., Davies, A., Bergner, B.

SPIE - The International Society of Optical Engineering
2 Conference Proceedings Traceable radius of curvature measurements on a micro-interferometer

Karodkar, D., Gardner, N., Bergner, B.C., Davies, A.

SPIE - The International Society of Optical Engineering
8 Conference Proceedings Interferometric figure metrology: enabling in-house traceability

Evans,C.J., Davies,A., Schmitz,T., Parks,R.E.

SPIE-The International Society for Optical Engineering
3 Conference Proceedings An Alternative Metrology Concept: Ray Trace Ranging

Hagenfeldt, N. M., Karlsson, A., Sequeira, J.

ESA Communications
9 Conference Proceedings Only stereo information improves performance in surgical tasks

Huber, J.W., Stringer, N.S., Davies, I.R.L., Field, D.

SPIE - The International Society of Optical Engineering
4 Conference Proceedings Wavefront sensing for 3D particle metrology and velocimetry [6292-20]

Angarita-Jaimes, N., McGhee, E., Chennaoui, M., Campbell, H. I., Zhang, S., Towers, C. E., Greenaways, A. H., Towers, D. …

SPIE - The International Society of Optical Engineering
10 Conference Proceedings Microlens testing: an application

H. L. Ng-Lee, S. C. E. Goh, C. S. N. Ranjit, Maryanto, J. Y. S. Ng

Society of Photo-optical Instrumentation Engineers
5 Conference Proceedings Retrace error evaluation on a figure-measuring interferometer [5869-35]

Gardner, N., Davies, A.

SPIE - The International Society of Optical Engineering
11 Conference Proceedings Dispersive interferometry using femtosecond pulse laser for measuring refractive index and physical thickness of test samples [6292-24]

Jao, K. -N., Kim, S. -W.

SPIE - The International Society of Optical Engineering
6 Conference Proceedings Self-calibration for microrefractive lens measurements

Gardner, N., Randolph, T., Davies, A.

SPIE - The International Society of Optical Engineering
12 Conference Proceedings Traceable atomic force microscope dimensional metrology at NIST [6152-25]

Dixson, R., Orji, N. G., Fu, J., Cresswell, M., Allen, R., Guthrie, W.

SPIE - The International Society of Optical Engineering
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12