TaN-based EUV mask absorber etch study [6283-84]
- Author(s):
Du, Y. Choi, J. C. Zhang, G. Park, -J. S. Yan, -Y. P. Baik, -H. K. ( Intel Corp. (USA) ) - Publication title:
- Photomask and Next-Generation Lithography Mask Technology XIII
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 6283
- Pub. Year:
- 2006
- Pt.:
- 2
- Page(from):
- 62833D
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819463586 [0819463582]
- Language:
- English
- Call no.:
- P63600/6283
- Type:
- Conference Proceedings
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