Blank Cover Image

Material selection and disc structure optimization studies for super-resolution readout with PtOx recording layer [6282-23]

Author(s):
  • Shima, T. ( National Institute of Advanced Industrial Science and Technology (Japan) )
  • Kikukawa, T. ( TDK Corp. (Japan) )
  • Nakano, T.
  • Tominaga, J. ( National Institute of Advanced Industrial Science and Technology (Japan) )
Publication title:
Optical Data Storage 2006 : 23-26 April 2006, Montreal, Canada
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6282
Pub. Year:
2006
Page(from):
62821T
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819463579 [0819463574]
Language:
English
Call no.:
P63600/6282
Type:
Conference Proceedings

Similar Items:

T. Shima, Y. Yamakawa, J. Tominaga, J. Kim

SPIE - The International Society of Optical Engineering

Hsu,W.-C., Tsai,S.-Y., Kuo,P.-C., Tseng,M.-R., Hsu,S.-P., Hung,T.-T., Chang,C.-J.

SPIE-The International Society for Optical Engineering

Nakano, T., Shima, T., Tominaga, J.

SPIE - The International Society of Optical Engineering

Tominaga,J., Nakano,T., Atoda,N.

SPIE-The International Society for Optical Engineering

Liu, Q., Tominaga, J., Fukaya, T.

SPIE - The International Society of Optical Engineering

Fuji,H., Tominaga,J., Nakano,T., Atoda,N., Katayama,H.

SPIE - The International Society for Optical Engineering

Shima, Takayuki, Kim, Johoo, Fuji, Hiroshi, Atoda, Nobufumi, Tominaga, Junji

Materials Research Society

Tominaga,J., Buechel,D., Nakano,T., Fuji,H., Fukaya,T., Atoda,N.

SPIE - The International Society for Optical Engineering

J. Kim, J. Bae, I. Hwang, Y. Lee, N. Kim, C. Chung, I. Park, T. Shima, T. Nakano, J. Tominaga

SPIE - The International Society of Optical Engineering

Tominaga, Junji, Nakano, Takashi, Atoda, Nobufumi

SPIE

Junji Tominaga, Paul Fons, Takayuki Shima, Kazuma Kurihara, Takashi Nakano, Alexander Kolobov, Stephane Petit

Materials Research Society

Sato,A., Tominaga,J., Nakano,T., Fuji,H., Atoda,N.

SPIE - The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12