Performance trends for the x-ray imaging spectrometer on Suzaku [6270-65]
- Author(s):
LaMarr, B. Bautz, M. Kissel, S. Meller, E. Prigozhin, G. ( Massachusetts Institute of Technology (USA) ) Tawa, N. Miyauchi, T. ( Osaka Univ. (Japan) ) Nakajima, H. ( Kyoto Univ. (Japan) ) - Publication title:
- Observatory operations : strategies, processes, and systems : 25-27 May 2006, Orlando, Florida, USA
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 6270
- Pub. Year:
- 2006
- Page(from):
- 62701R
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819463357 [0819463353]
- Language:
- English
- Call no.:
- P63600/6270
- Type:
- Conference Proceedings
Similar Items:
1
Conference Proceedings
Front- and back-illuminated x-ray CCD performance in low- and high-Earth orbit: performance trends of Suzaku XIS and Chandra ACIS detectors
Society of Photo-optical Instrumentation Engineers |
SPIE - The International Society of Optical Engineering |
2
Conference Proceedings
Energy response of the x-ray imaging spectrometer (XIS) on Suzaku [6266-151]
SPIE - The International Society of Optical Engineering |
8
Conference Proceedings
Mitigating CCD radiation damage with charge injection: first flight results from Suzaku
Society of Photo-optical Instrumentation Engineers |
3
Conference Proceedings
Ground calibration of x-ray CCD detectors with charge injection for the x-ray imaging spectrometer on Astro-E2
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
4
Conference Proceedings
Progress in x-ray CCD sensor performance for the Astro-E2 x-ray imaging spectrometer
SPIE - The International Society of Optical Engineering |
10
Conference Proceedings
Temperature dependence of charge transfer inefficiency in Chandra x-ray CCDs [6276-66]
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE |
SPIE-The International Society for Optical Engineering |