Blank Cover Image

Irma 5.1 multi-sensor signature prediction model [6239-12]

Author(s):
Savage, J.
Coker, C.
Edwards, D. ( Air Force Research Lab. (USA) )
Thai, B.
Aboutalib, O.
Chow, A.
Yamaoka, N.
Kim, C. ( Northrop Grumman Corp. (USA) )
3 more
Publication title:
Targets and backgrounds XII: characterization and representation : 17-18 April 2006, Kissimmee, Florida, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6239
Pub. Year:
2006
Page(from):
62390C
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819462954 [0819462950]
Language:
English
Call no.:
P63600/6239
Type:
Conference Proceedings

Similar Items:

J. Savage, C. Coker, B. Thai, O. Aboutalib, A. Chow, N. Yamaoka, C. Kim

SPIE - The International Society of Optical Engineering

Watson,J.S., Wellfare,M.R., Foster,J., Owens,M.A., Vechinski,D.A., Richards,M., Resnick,A., Underwood,V,

SPIE-The International Society for Optical Engineering

Savage, J., Coker, C., Thai, B., Aboutalib, O., Yamaoka, N., Kim, C.

SPIE - The International Society of Optical Engineering

J.S. Watson, D.S. Flynn, M.R. Wellfare, M. Richards, L. Prestwood

Society of Photo-optical Instrumentation Engineers

J. Savage, C. Coker, B. Thai, O. Aboutalib, J. Pau

Society of Photo-optical Instrumentation Engineers

Cathcart, M. J., Worrall, V. R., Cash, P. D.

SPIE - The International Society of Optical Engineering

Wellfare,M.R., Vechinski,D.A., Watson,J.S., Foster,J.L., Edwards,J.W., Richards,M., Coker,J.S., Coker,C.F.

SPIE - The International Society for Optical Engineering

Echevsky, G.V, Ayupov, A.B., Paukshtis, E.A., O'Rear, D.J., Kibby, C.L.

Elsevier

Owens,M.A., Wellfare,M.R., Foster,J., Watson,J.S., Vechinski,D.A., Richards,M., Underwood,V.

SPIE - The International Society for Optical Engineering

11 Conference Proceedings Reliability of signature and sensor models

Chenault,D.B., Flynn,D.S.

SPIE-The International Society for Optical Engineering

Watson,J.S., Wellfare,M.R., Chenault,D.B., Talele,S.E., Blume,B.T., Richards,M., Prestwood,L.

SPIE-The International Society for Optical Engineering

Simoneau, P., Caillault, K., Fauqueux, S., Huet, T., Krapez, C. J., Labarre, L., Malherbe, C., Miesch, C., Roblin, A., …

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12