Resistor array waveband nonuniformity measurements and RNUC band converter [6208-33]

Resistor array waveband nonuniformity measurements and RNUC band converter [6208-33]

Author(s):

Sisko, B. R. ( Aegis Technologies Group, Inc. (USA) )
Thompson, A. R. ( Air Force Research Lab. (USA) )
Marlow, A. S.
Sieglinger, A. B. ( Consultant for MacAulay-Brown Inc. (USA) )

Publication title:

Technologies for synthetic environments : hardware-in-the-loop testing XI : 18-20 April 2006, Kissimmee, Florida, USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

6208

Pub. Year:

2006

Page(from):

62080Y

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819462640 [0819462640]

Language:

English

Call no.:

P63600/6208

Type:

Conference Proceedings

Details

TDL ID:	ZA00016219
Series ID:	PA00000029
Conf. info. (Name):	Defense, Security, and Sensing : Technologies for synthetic environments
Conf. info. (Number):	2006 : 11th
Conf. info. (Venue):	Kissimmee, FL, USA
Conf. info. (Date):	2006.04.18-2006.04.20

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