Calibration and characterization of a low-background chamber in support of hardware-in-the-loop testing and modeling of infrared seekers (Invited Paper) [6208-11]

Author(s):

• Tschiegg, D. R.
• Conard, J. S.
• Thompson, L. P. ( The Johns Hopkins Univ. Applied Physics Lab. (USA) )
• Carter, A. ( The National Institute of Standards and Technology (USA) )

Publication title:

Technologies for synthetic environments : hardware-in-the-loop testing XI : 18-20 April 2006, Kissimmee, Florida, USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

6208

Pub. Year:

2006

Page(from):

62080B

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819462640 [0819462640]

Language:

English

Call no.:

P63600/6208

Type:

Conference Proceedings