A new nonuniformity correction algorithm for infrared line scanners [6207-34]

A new nonuniformity correction algorithm for infrared line scanners [6207-34]

Author(s):

Sui J.
Jin W.
Dong L.
Wang X. ( Beijing Institute of Technology (China) )

Publication title:

Infrared imaging systems : design, analysis, modeling, and testing XVII : 19-20 April 2006, Kissimmee, Florida, USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

6207

Pub. Year:

2006

Page(from):

62070Y

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819462633 [0819462632]

Language:

English

Call no.:

P63600/6207

Type:

Conference Proceedings

Details

TDL ID:	ZA00016218
Series ID:	PA00000029
Conf. info. (Name):	Defense, Security, and Sensing : Infrared imaging systems : design, analysis, modeling, and testing
Conf. info. (Number):	2006 : 17th
Conf. info. (Venue):	Kissimmee, FL, USA
Conf. info. (Date):	2006.04.19-2006.04.20

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