Spatial modeling of micron-scale gate length variation [6155-10]
- Author(s):
- Friedberg, P. ( Univ. of California, Berkeley (USA) )
- Cheung, W. ( Univ. of California, Berkeley (USA) )
- Spanos, C. J. ( Univ. of California, Berkeley (USA) )
- Publication title:
- Data analysis and modeling for process control III : 23 February, 2006, San Jose, California, USA
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 6155
- Pub. Year:
- 2006
- Page(from):
- 61550C
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819461988 [0819461989]
- Language:
- English
- Call no.:
- P63600/6155
- Type:
- Conference Proceedings
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