Experimental measurement of photoresist modulation curves [6154-113]

Experimental measurement of photoresist modulation curves [6154-113]

Author(s):

Bourov, A. ( Rochester Institute of Technology (USA) and Amphibian Systems (USA) )
Robertson, S. A. ( Rohm and Haas Electronic Materials (USA) )
Smith, B. W. ( Amphibian Systems (USA) )
Slocum, M. ( E. C. Pisconi. Amphibian Systems (USA) )

Publication title:

Optical Microlithography XIX

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

6154

Pub. Year:

2006

Pt.:

3

Page(from):

61542Z

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819461971 [0819461970]

Language:

English

Call no.:

P63600/6154

Type:

Conference Proceedings

Details

TDL ID:	ZA00016186
Series ID:	PA00000029
Conf. info. (Name):	SPIE Advanced Lithography : Optical Microlithography
Conf. info. (Number):	2006 : 19th
Conf. info. (Venue):	San Jose, CA, USA
Conf. info. (Date):	2006.02.21-2006.02.24

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