Critical dimension AFM tip characterization and image reconstruction applied to the 45-nm node [6152-107]

Critical dimension AFM tip characterization and image reconstruction applied to the 45-nm node [6152-107]

Author(s):

Dahlen, G. ( Veeco Instruments, Inc. (USA) )

Osborn, M. ( Veeco Instruments, Inc. (USA) )

Liu, H. C. ( Veeco Instruments, Inc. (USA) )

Jain, R. ( Veeco Instruments, Inc. (USA) )

Foreman, W. ( Veeco Instruments, Inc. (USA) )

Osborne, J. R. ( Veeco Instruments, Inc. (USA) )

1 more

Publication title:

Metrology, Inspection, and Process Control for Microlithography XX

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

6152

Pub. Year:

2006

Pt.:

2

Page(from):

61522R

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819461957 [0819461954]

Language:

English

Call no.:

P63600/6152

Type:

Conference Proceedings

Details

TDL ID:	ZA00016184
Series ID:	PA00000029
Conf. info. (Name):	SPIE Advanced Lithography : Metrology, Inspection, and Process Control for Microlithography
Conf. info. (Number):	2006 : 20th
Conf. info. (Venue):	San Jose, CA, USA
Conf. info. (Date):	2006.02.20-2006.02.23

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