Phase-shift mask for EUV lithography [6151-69]
- Author(s):
Constancias, C. ( CEA-LETI (France) ) Richard, M. ( CEA-LETI (France) ) Joyeux, D. ( CNRS/LCF-IOTA (France) ) Chiaroni, J. ( CEA-LETI (France) ) Blanc, R. ( CEA-LETI (France) ) Robic, J. Y. ( CEA-LETI (France) ) Quesnel, E. ( CEA-LETI (France) ) Muffato, V. ( CEA-LETI (France) ) - Publication title:
- Emerging Lithographic Technologies X
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 6151
- Pub. Year:
- 2006
- Pt.:
- 2
- Page(from):
- 61511W
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819461940 [0819461946]
- Language:
- English
- Call no.:
- P63600/6151
- Type:
- Conference Proceedings
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