Approximate model of clear-sky radiance distribution [6150-105]

Author(s):

Yang, C. P. ( Univ. of Electronic Science and Technology of China (China) )

Wu, J. ( Univ. of Electronic Science and Technology of China (China) )

Qiu, R. ( Univ. of Electronic Science and Technology of China (China) )

Wang, X. D. ( Univ. of Electronic Science and Technology of China (China) )

Liu, M. ( Univ. of Electronic Science and Technology of China (China) )

Leng, J ( Institute of AppLied Electronics, CAEP (China) )

1 more

Publication title:

2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

6150

Pub. Year:

2006

Pt.:

2

Page(from):

61504J

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819461896 [081946189X]

Language:

English

Call no.:

P63600/6150

Type:

Conference Proceedings