Study of low-contrast tracking based on wavelet transform [6150-66]

Author(s):

• Xu, K. ( Shandong Univ. of Science and Technology (China) )
• Liu, R. ( Shandong Univ. of Science and Technology (China) )
• Li, M. ( Shandong Univ. of Science and Technology (China) )
• Zeng, Q ( Shandong Univ. of Science and Technology (China) )

Publication title:

2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

6150

Pub. Year:

2006

Pt.:

2

Page(from):

61503M

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819461896 [081946189X]

Language:

English

Call no.:

P63600/6150

Type:

Conference Proceedings