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Wavelet digital filter method for image processing of 3D measurement profilometry [6150-02)

Author(s):
Wang, Y. S. ( Shandong Univ. (China) )
Fu, S. ( Shandong Univ. (China) )
Xu, J. Q. ( Shandong Univ. (China) )
Zhou, C. I. ( Shandong Univ. (China) )
Si S C ( Shandong Univ. (China) )
Gao C Y ( Shandong Univ. (China) )
1 more
Publication title:
2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6150
Pub. Year:
2006
Pt.:
1
Page(from):
615010
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819461896 [081946189X]
Language:
English
Call no.:
P63600/6150
Type:
Conference Proceedings

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