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Study on precise measurement of high reflectivity by cavity ring-down spectroscopy (Invited Paper) [6150-160]

Author(s):
Ren, G. ( Sichuan Univ. (China) )
Cai, B. ( Sichuan Univ. (China) )
Zhang, B. ( Sichuan Univ. (China) )
Xiong, S. ( Institute of Optics and Electronics, CAS (China ) )
Huang, W. ( Institute of Optics and Electronics, CAS (China ) )
Gao, L. ( Institute of Optics and Electronics, CAS (China ) )
1 more
Publication title:
2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6150
Pub. Year:
2006
Pt.:
1
Page(from):
61500O
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819461896 [081946189X]
Language:
English
Call no.:
P63600/6150
Type:
Conference Proceedings

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