500-mm aperture wavelength-tuning phase-shifting interferometer (Invited Paper) [6150-151]
- Author(s):
Chai, L. ( Fine Optical Engineering Research Ctr. (China) ) Xu, Q. ( Fine Optical Engineering Research Ctr. (China) ) Deng, Y. ( Fine Optical Engineering Research Ctr. (China) ) Cheng, G. ( Fine Optical Engineering Research Ctr. (China) ) Xu, J. ( Fine Optical Engineering Research Ctr. (China) ) Shi, Q. ( Fine Optical Engineering Research Ctr. (China) ) - Publication title:
- 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 6150
- Pub. Year:
- 2006
- Pt.:
- 1
- Page(from):
- 61500E
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819461896 [081946189X]
- Language:
- English
- Call no.:
- P63600/6150
- Type:
- Conference Proceedings
Similar Items:
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
SPIE-The International Society for Optical Engineering |
9
Conference Proceedings
Monolithic wavelength-graded VCSEL and wavelength-selective photodetector arrays for wavelength-division-multiplexed optical interconnect applications (Invited …
SPIE-The International Society for Optical Engineering |
4
Conference Proceedings
Phase-shifting via wavelength tuning in very large aperture interferometers
SPIE - The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |