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Simulation of susceptibility-induced distortions in fMRI [6144-239]

Author(s):
Xu, N. ( Vanderbilt Univ. (USA) )
LI, Y. ( Vanderbilt Univ. (USA) )
Paschal, C. B. ( Vanderbilt Univ. (USA) )
Gatenby, J. C. ( Vanderbilt Univ. (USA) )
Morgan, V. L. ( Vanderbilt Univ. (USA) )
Pickens, D. R. ( Vanderbilt Univ. (USA) )
Dawant, B. M. ( Vanderbilt Univ. (USA) )
Fitpatrick, J. M. ( Vanderbilt Univ. (USA) )
3 more
Publication title:
Medical Imaging 2006: Image Processing
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6144
Pub. Year:
2006
Pt.:
3
Page(from):
614461
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
16057422
ISBN:
9780819464231 [0819464236]
Language:
English
Call no.:
P63600/6144
Type:
Conference Proceedings

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